Low-Temperature Sintered Silver Paste: Securing a Pivotal Role in the Semiconductor Gold Rush, from SiC Modules to AI Chips
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Low-Temperature Sintered Silver Paste: Securing a Pivotal Role in the Semiconductor Gold Rush, from SiC Modules to AI Chips

Publish Date: Jun 6
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Low-Temperature Sintered Silver Paste (LTSSP) represents a transformative advancement in semiconductor packaging. This high-performance interconnect material utilizes silver powder as its primary constituent, enabling robust bonding between chips and substrates through a specialized low-temperature sintering process (typically 150-200°C), often under minimal or zero external pressure. Its formulation relies on a sophisticated blend of nano-scale (<50 nm) and micro-scale silver particles, combined with sintering aids and silver precursors. This precise engineering facilitates diffusion and densification at remarkably low thermal budgets, forming a highly conductive and mechanically robust silver joint layer.

Material Properties & Performance Benchmarks:

LTSSP exhibits exceptional properties critical for advanced electronics:
Thermal Conductivity: >100 W/m·K (significantly exceeding traditional solder pastes ~60-80 W/m·K and conductive adhesives ~1-5 W/m·K). Leading formulations, like Kyocera's optimized material, achieve >200 W/m·K, approaching 50% of bulk silver (429 W/m·K).
Electrical Resistivity: <10 μΩ·cm (nearer to bulk silver's 1.6 μΩ·cm than Sn-Ag-Cu solder's ~12 μΩ·cm).
Die Shear Strength: >25 MPa, with advanced versions exceeding 40 MPa, satisfying stringent automotive reliability standards (e.g., AEC-Q101).
High-Temperature Stability: Sintered joints demonstrate excellent stability exceeding 500°C, far surpassing the performance cliff of lead-free solders (e.g., Sn-Ag-Cu) above 175°C.
Reliability: Validated through accelerated stress testing, including 1000+ cycles of thermal shock (-55°C to 175°C), showcasing superior resistance to thermomechanical fatigue.

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Overcoming Traditional Limitations:

The core innovation lies in drastically reducing sintering temperatures. While conventional nano-silver pastes require 250–300°C, LTSSP achieves robust bonding below 200°C. This is accomplished through:
1.Nanoparticle Surface Energy Leverage: Utilizing ultra-fine silver particles (<50 nm) significantly lowers the activation energy required for sintering initiation (Herring's scaling law).
2.Advanced Formulation Chemistry: Incorporation of specialized dispersants prevents agglomeration, while tailored reductants and organic carriers facilitate efficient particle fusion and densification kinetics at lower temperatures.
3.Pressureless/ Low-Pressure Processing: Enabling void formation control (<5% porosity) and minimizing mechanical stress on delicate chips (especially ultra-thin SiC/GaN dies) and substrates (e.g., AlN, AMB).

Enabling Power & Wide Bandgap Semiconductors:

LTSSP is indispensable for SiC and GaN power devices operating at junction temperatures (Tj) exceeding 200°C and high power densities:
Thermal Management: Directly bonded interfaces with LTSSP significantly reduce thermal resistance (e.g., demonstrated 28% reduction in EV traction inverter modules) compared to solder, improving heat dissipation and allowing higher operating currents.
Lifetime & Reliability: Eliminates thermal fatigue issues inherent in solder joints (Coefficient of Thermal Expansion (CTE) mismatch). Double-sided silver sintering in SiC modules has demonstrated >10x improvement in power cycling lifetime versus solder.
Process Compatibility: The low processing temperature prevents thermal degradation of SiC/GaN chips and sensitive ceramic substrates (AlN, Si3N4), avoiding the interfacial delamination risks associated with high-temperature solders or the poor thermal performance of conductive adhesives.

Revolutionizing Advanced Packaging for AI/HPC:

LTSSP's unique properties make it ideal for high-density interconnects in 2.5D/3D integration and heterogeneous integration (Chiplets):
Fine-Pitch & Thin-Layer Capability: Sintered layer thickness can be precisely controlled between 20-50 μm (≈1/3 of typical solder layers), enabling ultra-fine interconnect pitches required for high-I/O density.
Low Porosity & High Strength: <5% porosity ensures excellent electrical conductivity and mechanical integrity crucial for stacked die structures under thermal stress.
Scalability: Demonstrated suitability for large panel-level processing (e.g., 310mm x 310mm substrates).
Application Example: TSMC's SoW-X (System on Wafer) leverages silver sintering for robust, high-thermal-conductivity bonding in its 12+ layer HBM (High Bandwidth Memory) stacks, contributing to reported AI chip performance gains of up to 30%.

Global Innovation Landscape:

Kyocera (Japan): Leads in performance optimization, achieving thermal conductivity >200 W/m·K and shear strength >40 MPa, certified for automotive applications.
Mopai Semiconductor (China): Patent CN119799170A details a domestic LTSSP achieving pressureless sintering at 180°C, Cu substrate adhesion >25 MPa, and thermal conductivity >120 W/m·K, marking significant progress in import substitution.
Shanren New Materials (China): AS9378 targets large-area applications, reducing sintering temperature to 150°C for panel-level packaging (310mm x 310mm) and offering a 15% cost reduction.

Future Trajectory & Strategic Significance:

LTSSP is rapidly evolving beyond power semiconductors into frontier domains:
Photonics/CPO: Enabling low-thermal-resistance, high-reliability bonding for laser diodes and modulators in co-packaged optics.
Quantum Computing: Providing ultra-clean, stable interconnects critical for qubit coherence in cryogenic environments.
Advanced RF Modules: Supporting high-power density and thermal management needs in 5G/6G infrastructure.
Driven by the explosive growth in EVs, renewable energy, AI, and HPC, coupled with intense global competition and supply chain localization efforts, the LTSSP market is poised for accelerated technological iteration and substantial expansion. Its role as a cornerstone material for next-generation semiconductor performance and reliability is unequivocally cemented.

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